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Description
1. Mega-Idea 17 Series motherboard layered test frame, easily solves the troublesome problem of motherboard testing, insists on using BeCu spring probes, applicable to iPhone 17 / 17 Air / 17 Pro / 17Pro Max
2. Compatible with mobile phone models, based on many years of rich experience in test frame products
3. CNC high-precision machining controls every detail
4. The double-headed probe accurately aligns the small holes to improve the contact performance, fastens with fixed buckles, so the motherboard will not warp, and the test data is more accurate
5. With good conductivity, stable overload, small deviation in detected values, and more accuracy, the tapered probe is not easily stained by rosin and solder
6. Spring buckle, quick rebound, convenient, and fast
7. Anti-slip foot pads, anti-slip, wear-resistant, and more stab
2. Compatible with mobile phone models, based on many years of rich experience in test frame products
3. CNC high-precision machining controls every detail
4. The double-headed probe accurately aligns the small holes to improve the contact performance, fastens with fixed buckles, so the motherboard will not warp, and the test data is more accurate
5. With good conductivity, stable overload, small deviation in detected values, and more accuracy, the tapered probe is not easily stained by rosin and solder
6. Spring buckle, quick rebound, convenient, and fast
7. Anti-slip foot pads, anti-slip, wear-resistant, and more stab
Specification:
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